Electron Microscopes
Electron Microscopy Sciences AFM Substrate Type P Silicon Wafer 3", 76 mm diameter, <111> Orientation
These silicon wafers can be used for substrate studies or as substrate for AFM and SEM samples by cleaving the wafer. The wafers are polished on one side.
Diameter: 76 mm
Orientation: <111>
Thickness: 345-470 µm
Roughness: 2nm
Resistance: 1-30 ohms
Ted Pella Inc Ultrathin Carbon Film on Lacey Carbon Support Film, 300 mesh, Gold, 25/pk
Pure carbon support films with no Formvar backing. This new product has an even thinner carbon film which is mounted on a Lacey carbon film. The carbon support layer lying over the holes is less than 3nm in thickness and is the thinnest support film available. It is particularly useful for high resolution microscopy of low contrast particles and is also ideal for use with the Energy Filtering TEM.
Electron Microscopy Sciences EMS 200 mesh Square Grid, Copper-Rhodium
Grids are 3.05 mm diameter.
Grid: Copper-Rhodium
Thickness: Up to 27 µm, +/- 5 µm
Pitch: 125 µm
Hole: 90 µm
Bar: 35 µm